Data Analytics and Reliability Test Architect:
- To enable proactive methodology for intrinsic and extrinsic defectivity (DPM) reduction at wafer level using advanced Machine Learning/Deep Learning product-dispo techniques.
- To develop state-of-art and advanced algorithms, encompassing Machine Learning and Deep Learning models to boost and enhance data-mining and pattern recognition for quality and yield improvement.
- To work with Product/Fab/Engineering teams on product issues (yield/intrinsic/cell/qualification/defectivity/RMA/deviations) in problem analysis, data-mining and modeling, to provide optimal disposition solution.
- Support design, implementation and maintenance of REL data pipeline system
- Develop tailored made machine learning solution and collaborate with TPG data science team to translate idea to data science prototypes
- Designing and maintaining ML production system that continuously operate in production
- Work with IT team and vendor to enable cloud platform in Micron environment
- Continuous improve software build by investigating alternatives and technologies in support of systems development efforts
